Scanning near-field optical microscope with a laser diode and nanometer-sized bit recording

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 122-127

  Hosaka, S ^a   Shintani, T ^a   Miyamoto, M ^a   Hirotsune, A ^a   Terao, M ^a   Yoshida, M ^a   Honma, S ^b   Kammer S ^c  

^a HITACHI LTD   (Japan)

^b Nissei Sangyo Co Ltd   (Japan)

^c TopoMetrix Corporation   (United States)

Author keywords

Nanostructures; Optical properties; Optical spectroscopy; Phase transitions

Indexed keywords

DEFORMATION; NANOSTRUCTURED MATERIALS; OPTICAL FILMS; OPTICAL RECORDING; PHASE TRANSITIONS; POLYCARBONATES; PULSED LASER APPLICATIONS; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR LASERS; SUBSTRATES;

PHASE CHANGE RECORDING; SCANNING NEAR FIELD OPTICAL MICROSCOPY; ULTRAHIGH RECORDING DENSITY;

OPTICAL MICROSCOPY;

EID: 0030079951     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06803-1     Document Type: Article

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