Optical characterization of probes for photon scanning tunnelling microscopy

Journal of Microscopy

Volumn 194, Issue 2-3, 1999, Pages 311-316

  Vohnsen, B ^a   Bozhevolnyi, S I ^b  

^a AALBORG UNIVERSITY   (Denmark)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

Evanescent waves; Near field optics; Optical transfer function; Passive probe; Photon scanning tunnelling microscopy; Probe characterization

Indexed keywords

GEOMETRICAL OPTICS; MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL FIBERS; OPTICAL IMAGE STORAGE; PHOTONS; PROBES; SCANNING TUNNELING MICROSCOPY;

EVANESCENT WAVE; NEAR FIELD OPTICS; OPTICAL CHARACTERIZATION; OPTICAL IMAGING; PASSIVE PROBE; PHOTON SCANNING TUNNELING MICROSCOPE; PHOTON SCANNING TUNNELING MICROSCOPY; PROBE CHARACTERIZATION; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; SUBWAVELENGTH SCALE;

OPTICAL TRANSFER FUNCTION;

CONFERENCE PAPER; ILLUMINATION; IMAGE QUALITY; LIGHT SCATTERING; OPTICAL RESOLUTION; PRIORITY JOURNAL; RADIATION PHYSICS; SCANNING TUNNELING MICROSCOPY;

EID: 0032988725     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00518.x     Document Type: Conference Paper

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