Quantitative high-resolution electron microscopy of interfaces

Materials Science Forum

Volumn 207-209, Issue PART 1, 1996, Pages 23-34

  Ernst, F ^a   Hofmann, D ^a   Nadarzinski, K ^a   Schmidt, C ^a   Stemmer, S ^a   Streiffer, S K ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Atomistic Structure; Domain Boundaries; Quantitative HRTEM; Twin Boundaries

Indexed keywords

COMPUTER SIMULATION; COPPER; CRYSTAL ATOMIC STRUCTURE; GRAIN BOUNDARIES; LEAD COMPOUNDS; MATHEMATICAL MODELS; NICKEL ALLOYS; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

DOMAIN BOUNDARIES; LEAD TITANATE; NICKEL ALUMINUM ALLOYS; QUANTITATIVE HIGH RESOLUTION ELECTRON MICROSCOPY; TWIN BOUNDARIES;

INTERFACES (MATERIALS);

EID: 3543065687     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.207-209.23     Document Type: Article

References (13)

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7. C. Schmidt, M.W. Finnis, V. Vitek, and F. Ernst, in Intergranular and Interphase Boundaries 1995, Trans Tech Publications, this volume.
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11. G. Möbus and F. Phillipp, unpublished.
12. K. Nadarzinski and F. Ernst, in preparation.
13. K. Nadarzinski and F. Ernst, in Intergranular and Interphase Boundaries 1995, Trans Tech Publications, this volume.