Simulation of XRD patterns from oriented clay minerals by WinStruct

Computers and Geosciences

Volumn 25, Issue 4, 1999, Pages 501-509

  Krumm, S ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

Author keywords

Clay minerals; Modelling; Size strain analysis; X ray diffraction

Indexed keywords

CLAY MINERAL; INTERNET; SOFTWARE; X-RAY DIFFRACTION;

EID: 0032809833     PISSN: 00983004     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0098-3004(98)00155-1     Document Type: Article

References (18)

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