Angle-resolved X-ray photoelectron spectroscopy of topmost surface for LaNiO 3 thin film grown on SrTiO 3 substrate by laser molecular beam epitaxy

Applied Surface Science

Volumn 137, Issue 1-3, 1999, Pages 98-102

  Chen, P ^a   Xu, S Y ^a   Lin, J ^a   Ong, C K ^a   Cui, D F ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b INSTITUTE OF PHYSICS   (China)

Author keywords

ARXPS; LaNiO 3; Laser MBE; Topmost surface

Indexed keywords

CRYSTAL ORIENTATION; FERROELECTRIC MATERIALS; FILM GROWTH; LANTHANUM COMPOUNDS; LASER APPLICATIONS; MOLECULAR BEAM EPITAXY; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; STRONTIUM COMPOUNDS; SUBSTRATES; SURFACE PHENOMENA; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

LANTHANUM NICKEL OXIDE; LASER MOLECULAR BEAM EPITAXY; STRONTIUM TITANATE;

DIELECTRIC FILMS;

EID: 0032762475     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00377-8     Document Type: Article

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