Structural characterization of Cu metallic clusters in amorphous SiO2 by synchrotron radiation grazing incidence X-ray scattering and diffraction

Materials Science Forum

Volumn 278-281, Issue PART 2, 1998, Pages 891-896

  D'Acapito, F ^a,b   Thiaudiere, D ^a   Zontone, F ^a   Regnard, J R ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b CNR   (Italy)

^c CEA GRENOBLE   (France)

Author keywords

Ion Implantation; Metallic Quantum Dots; Non Linear Optical Materials; Small Angle X Ray Scattering; X Ray Diffraction

Indexed keywords

HEAVY IONS; ION IMPLANTATION; LATTICE CONSTANTS; SEMICONDUCTOR QUANTUM DOTS; SILICA; SYNCHROTRON RADIATION; SYNCHROTRONS; ULTRATHIN FILMS; X RAY DIFFRACTION; AMORPHOUS MATERIALS; ANNEALING; CRYSTAL LATTICES; ELECTROMAGNETIC WAVE SCATTERING; OPTICAL MATERIALS; PHASE TRANSITIONS; X RAY CRYSTALLOGRAPHY;

GRAZING INCIDENCE SMALL-ANGLE X-RAY SCATTERING; GRAZING INCIDENCE X-RAY DIFFRACTION; GRAZING-INCIDENCE X-RAY SCATTERING; METALLIC QUANTUM DOTS; NON-LINEAR OPTICAL MATERIAL; STRUCTURAL CHARACTERIZATION; STRUCTURAL INVESTIGATION; SYNCHROTRON RADIATION SOURCE;

X RAY SCATTERING; COPPER;

GRAZING INCIDENCE SMALL X RAY SCATTERING;

EID: 0031646135     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: None     Document Type: Article

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