Epitaxial relationships and electrical properties of vanadium oxide films on r-cut sapphire

Thin Solid Films

Volumn 338, Issue 1-2, 1999, Pages 60-69

  Bialas, H ^a   Dillenz, A ^a,b   Downar, H ^b   Ziemann, P ^a  

^a UNIVERSITY OF ULM   (Germany)

^b AIRBUS GROUP INNOVATIONS   (Germany)

Author keywords

Conductivity; Epitaxy; Vanadium oxide; X ray diffraction

Indexed keywords

CRYSTAL ORIENTATION; ELECTRIC CONDUCTIVITY OF SOLIDS; EPITAXIAL GROWTH; FILM GROWTH; SAPPHIRE;

METAL-TO-INSULATOR TRANSITION; VANADIUM OXIDE;

VANADIUM COMPOUNDS;

EID: 0032734631     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00995-X     Document Type: Article

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