On extended energy-loss fine structure data analysis for obtaining reliable structural parameters

Journal of Electron Microscopy

Volumn 48, Issue 5, 1999, Pages 525-529

  Kobayashi, Yumiko ^a   Muto, Shunsuke ^a   Echer, Charles J ^b   Tanabe, Tetsuo ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Debye Waller factor; EXELFS; Inter atomic distance; Radial distribution function

Indexed keywords

ATOMIC PHYSICS; DATA HANDLING; DISTRIBUTION FUNCTIONS; ENERGY DISSIPATION; INFORMATION ANALYSIS; PHONONS;

COORDINATION NUMBER; DEBYE WALLER FACTOR; EXTENDED ENERGY LOSS FINE STRUCTURES; INTER-ATOMIC DISTANCES; PRACTICAL GUIDELINES; RADIAL DISTRIBUTION FUNCTIONS; RATIO METHOD; SAMPLE THICKNESS; STRUCTURAL PARAMETER; STRUCTURE DATA;

CURVE FITTING;

EID: 0032716712     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023711     Document Type: Article

References (9)

1. Sayers D E, Stern E A, and Lytle F W (1971) New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray-absorption fine structure. Phys. Rev Lett. 27: 1204-1207.
2. Leapman R D and Cosslett V E (1976) Extended fine structure above the X-ray edge in electron energy loss spectra J. Phys. D 9: L29-32.
3. Teo B K (1986) EXAFS: Basic Principles and Data Analysis. (Springer-Verlag, New York.)
4. Haskel D, Sarikaya, Qian M, and Stern E A (1995) EXELFS as a tool for quantifying phase distributions in materials. Ultramicroscopy 58: 353-364.
5. Qian M, Sarikaya M, and Stern E A (1995) Development of the EXELFS technique for high accuracy structural information. Ultramicroscopy 59: 137-147.
6. Qian M, Sarikaya M, and Stern E A (1997) EXELFS χ-data renormalization. Ultramicroscopy. 68: 163-171.
7. Muto S and Kobayashi Y (1998) The Influence of X-ray irradiation on structural relaxation and crystallization of amorphous silicon films. Jpn. J. Appl. Phys. 37: 5890-5893.
8. Takeuchi M, Muto S, Tanabe T, Arai S, and Kuroyanagi T (1997) Damage process in electron-irradiated graphite studied by transmission electron microscopy. II. Analysis of extended energy-loss fine structure of highly oriented pyrolytic graphite. Phil. Mag. 76: 691-700.
9. Egerton R F (1986) Electron Energy Loss Spectroscopy in the Electron Microscope. (Plenem Press, New York.)