Electron microscopy of high-T(c) Josephson junctions formed in the epitaxial layer ramp-edge geometry: YBCO/barrier/YBCO

Micron

Volumn 30, Issue 5, 1999, Pages 539-559

  Merkle, K L ^a   Huang, Y ^a   Rozeveld, S ^a   Char, K ^b   Moeckly, B H ^b  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b 969 Maude Ave ^*  (United States)

Author keywords

Metallic oxide barriers; Ramp edge junctions; YBCO microstructures

Indexed keywords

EID: 0032697186     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00053-0     Document Type: Article

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