Observation of magnetic fine structures by electron differential microscopy

Materials Characterization

Volumn 42, Issue 4, 1999, Pages 183-192

  Tanji, T ^a   Manabe, S ^a   Yamamoto, K ^a   Hirayama, T ^b  

^a NAGOYA UNIVERSITY   (Japan)

^b JFCC   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; HOLOGRAMS; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; MAGNETIC FLUX; SENSITIVITY ANALYSIS; THIN FILMS;

ELECTRON DIFFERENTIAL MICROSCOPY; LORENZ MICROGRAPHS; MAGNETIC FINE STRUCTURES; OFF-AXIS ELECTRON HOLOGRAPHY; PERMALLOY THIN FILMS;

MAGNETIC MATERIALS;

EID: 0032691861     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(99)00013-3     Document Type: Article

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