Differential microscopy by conventional electron off-axis holography

Applied Physics Letters

Volumn 69, Issue 18, 1996, Pages 2623-2625

  Tanji, Takayoshi ^a   Ru, Qingxin ^b   Tonomura, Akira ^c  

^a NAGOYA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012994934     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117555     Document Type: Article

References (12)

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