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Volumn 2, Issue , 1994, Pages 203-204
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10 to 72-Gb/s, optoelectronic RZ pulse-pattern generation and its application to on-wafer large-signal characterization for ultrahigh-speed electronic devices
a
a
NTT CORPORATION
(Japan)
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Author keywords
[No Author keywords available]
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Indexed keywords
BANDWIDTH;
BIT ERROR RATE;
LASER PULSES;
LIGHT AMPLIFIERS;
LIGHT MODULATORS;
OPTICAL VARIABLES MEASUREMENT;
PHASE MODULATION;
PULSE GENERATORS;
SEMICONDUCTOR LASERS;
WAVEFORM ANALYSIS;
BIT ERROR RATE MEASUREMENT;
ELECTROOPTIC PHASE MODULATION;
GROUP VELOCITY DISPERSION;
MULTIQUANTUM WELL ELECTROABSORPTION MODULATORS;
OPTICAL PULSE PATTERNS;
OPTICAL TO ELECTRICAL CONVERSION;
OPTOELECTRONIC RANDOM PULSE GENERATOR;
PHASE MODULATORS;
OPTOELECTRONIC DEVICES;
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EID: 0028714235
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (10)
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References (5)
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