Recent progress in microthermal analysis

American Laboratory

Volumn 31, Issue 1, 1999, Pages 13-16

  Reading, Mike ^a   Price, Duncan M ^a   Pollock, Hubert M ^b   Hammiche, Azzedine ^b   Murray, Andrew ^c  

^a LOUGHBOROUGH UNIVERSITY   (United Kingdom)

^b LANCASTER UNIVERSITY   (United Kingdom)

^c Topometrix Corp   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFERENTIAL THERMAL ANALYSIS; LIGHT EMITTING DIODES; PYROLYSIS; TEMPERATURE; THERMOANALYSIS;

MICROTHERMAL ANALYSIS; PULSED FORCE MODE;

INFRARED IMAGING;

EID: 0032672083     PISSN: 00447749     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (5)

1. Hammiche A, Pollock HM, Hourston DJ, Reading M, Song M. Microelectronics and nanostructures. J Vac Sci Technol B 1996; 14:1486-91.
2. Hammiche A, Reading M, Pollock HM, Song M, Hourston DJ. Rev Sci Instrum 1996; 67:4268-74.
3. Reading M, Hourston D, Song M, Pollock H, Hammiche A. Am Lab 1998; 30(1):13-7.
4. Lever TJ, Price D. Am Lab 1998; 30(16):15-8.
5. Rosa A, Weilandt E, Hild S, Marti O. Measur Sci Techn 1997; 3:1333-8.