Observation and analysis of breakdown of magnetic tunnel junctions

Journal of Magnetism and Magnetic Materials

Volumn 198, Issue , 1999, Pages 164-166

  Oepts, W ^a   Verhagen, H J ^a   De Mooij, D B ^b   Zieren, V ^b   Coehoorn, R ^b   De Jonge, W J M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; COBALT; COBALT ALLOYS; ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC POTENTIAL; MAGNETORESISTANCE; TUNNEL JUNCTIONS;

MAGNETIC TUNNEL JUNCTIONS;

MAGNETIC DEVICES;

EID: 0032668435     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(98)01048-8     Document Type: Article

References (6)

1. Moodera J.S., Kinder L.R., Wong T.M., Merservey R. Phys. Rev. Lett. 74:1995;3273.
2. Oepts W., Verhagen H.J., Coehoorn R., de Jonge W.J.M. Appl. Phys. Lett. 73:1998;2363.
3. Simmons J.G. J. Appl. Phys. 34:1963;1793.
4. E.M. Fleuren, Proc. 21st IEEE Int. Reliability Phys. Symp. 148 (1983).
5. Degraeve R., Ogier J.L., Bellens R., Roussel P.J., Groeseneken G., Maes H.E. IEEE Trans. Electron Devices. 45:1998;472.
6. W. Oepts, H.J. Verhagen, R. Coehoorn, W.J.M. de Jonge, in preparation.