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Volumn 32, Issue 12, 1999, Pages 1319-1328

Crystallization of In2Se3 semiconductor thin films by post-deposition heat treatment. Thickness and substrate effects

(2)  Emziane, M a   Le Ny, R a  

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; DEPOSITION; ENERGY DISPERSIVE SPECTROSCOPY; EVAPORATION; PHOTOELECTRON SPECTROSCOPY; POLYCRYSTALLINE MATERIALS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; THIN FILMS; X RAY CRYSTALLOGRAPHY;

EID: 0032656688     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/12/307     Document Type: Article
Times cited : (29)

References (14)
  • 11
    • 0344433621 scopus 로고    scopus 로고
    • JCPDS, card No 40-1407, International Centre for Diffraction Data, New York
    • 1997 JCPDS, card No 40-1407, International Centre for Diffraction Data, New York
    • (1997)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.