New γ-In2Se3/TCO (SnO2 or ZnO) thin film rectifying heterojunction

Thin Solid Films

Volumn 315, Issue 1-2, 1998, Pages 5-8

  Marsillac, S ^a   Bernede J C ^a  

^a Equipe Couches Minces Mat Nouveaux   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING TIN COMPOUNDS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; THERMAL EFFECTS; THIN FILMS; VOLTAGE MEASUREMENT; ZINC OXIDE;

SOLID STATE REACTION;

SEMICONDUCTING FILMS;

EID: 0032473332     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)00462-8     Document Type: Article

References (10)

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7. J.C. Bernede, S. Marsillac, Materials Research Bulletin, to be published (1997).
8. Y. Hasegawa, Y. Abe, Phys. Stat. Sol. (A) 70 (1982) 615.
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