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Volumn 275, Issue 3-4, 1997, Pages 266-272

Growth of biaxially textured buffer layers on rolled-Ni substrates by electron beam evaporation

Author keywords

Biaxial texture; Buffer layers; E beam evaporation; Rolled Ni substrates

Indexed keywords

CRACK INITIATION; CRYSTAL ORIENTATION; ELECTRON BEAMS; EPITAXIAL GROWTH; EVAPORATION; FILM GROWTH; NICKEL; RARE EARTHS; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; TEXTURES; ZIRCONIA;

EID: 0031077646     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(96)00713-7     Document Type: Article
Times cited : (171)

References (16)
  • 13
    • 0029233835 scopus 로고
    • Evolution of thin film and surface structure and morphology
    • Eds. B.G. Demczyk, E.D. Williams, E. Garfunkel, B.M. Clemens and J.J. Cuomo, ISDN 1-55899-256-1
    • Chunyan Tian, Yang Du and Siu-Wai Chan, Evolution of Thin Film and Surface Structure and Morphology, Eds. B.G. Demczyk, E.D. Williams, E. Garfunkel, B.M. Clemens and J.J. Cuomo, Mater. Res. Soc. Proc. 355 (1995) ISDN 1-55899-256-1.
    • (1995) Mater. Res. Soc. Proc. , vol.355
    • Tian, C.1    Du, Y.2    Chan, S.-W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.