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Volumn 377-379, Issue , 1997, Pages 958-962
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2D and 3D silver adlayers on TiO2(110) surfaces
a a a b c |
Author keywords
Atomic force microscopy; Growth; Low index single crystal surfaces; Reflection spectroscopy; Silver; Surface defects; Titanium oxide
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CRYSTAL DEFECTS;
FILM GROWTH;
INTERFACIAL ENERGY;
MORPHOLOGY;
REACTION KINETICS;
SURFACE STRUCTURE;
TITANIUM DIOXIDE;
VACUUM APPLICATIONS;
SURFACE DIFFERENTIAL REFLECTANCE (SDR);
ULTRAHIGH VACUUM (UHV);
METALLIC FILMS;
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EID: 17344377195
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(96)01529-4 Document Type: Article |
Times cited : (30)
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References (16)
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