Imaging of high-power microwave-induced surface flashover

IEEE Transactions on Plasma Science

Volumn 27, Issue 1, 1999, Pages 138-139

  Neuber, A ^a,b   Hemmert, D ^b   Dickens, J ^a,b   Krompholz, H ^a,b   Hatfield, L L ^a,b   Kristiansen, M ^a,b  

^a IEEE   (United States)

^b TEXAS TECH UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH POWER MICROWAVES; OPTICAL IMAGING; SURFACE FLASHOVER; X RAY IMAGING;

DIELECTRIC MATERIALS; ELECTROMAGNETIC FIELDS; ELECTRONS; IMAGING TECHNIQUES; INTERFACES (MATERIALS); LIGHT EMISSION; MICROWAVE DEVICES; PLASMA DENSITY; RADIATION; SURFACES; VACUUM; X RAYS;

FLASHOVER;

EID: 0032651693     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/27.763092     Document Type: Article

References (4)

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3. A. Neuber, J. Dickens, D. Hemmert, H. Krompholz, L. L. Hatfield, and M. Kristiansen, "Window breakdown caused by high power microwaves," IEEE Trans. Plasma Sci., vol. 26, pp. 296-303, June 1998.
4. _, "Breakdown of dielectric interfaces caused by high power microwaves," presented at the IEEE Int. Conf. Plasma Sci., Raleigh, NC, 1998.