Window breakdown caused by high-power microwaves

IEEE Transactions on Plasma Science

Volumn 26, Issue 3, 1998, Pages 296-303

  Neuber, A ^a   Dickens, James ^a   Hemmert, David ^a   Krompholz, H ^a   Hatfield, L L ^a   Kristiansen, Magne ^a  

^a TEXAS TECH UNIVERSITY   (United States)

Author keywords

Breakdown; High power microwaves; Interfaces

Indexed keywords

ALUMINA; DIELECTRIC WAVEGUIDES; ELECTRIC BREAKDOWN; ELECTROMAGNETIC FIELD EFFECTS; ELECTROMAGNETIC WAVE EMISSION; FLASHOVER; INTERFACES (MATERIALS); MAGNETRONS; MICROWAVES; RESONATORS; SURFACE DISCHARGES; X RAYS;

TRAVELING WAVE RESONATORS;

DIELECTRIC MATERIALS;

EID: 0032099990     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/27.700757     Document Type: Article

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