Breakdown of dielectric/vacuum interfaces caused by high power microwaves

IEEE International Conference on Plasma Science

Volumn , Issue , 1998, Pages 205-

  Neuber, A ^a   Dickens, J ^a   Hemmert, D ^a   Krompholz, H ^a   Hatfield, L L ^a   Kristiansen, M ^a  

^a TEXAS TECH UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; DIELECTRIC MATERIALS; ELECTRON EMISSION; INTERFACES (MATERIALS); MAGNETRONS; MICROWAVES; RESONATORS; VACUUM APPLICATIONS; WAVEGUIDES;

TRAVELING WAVE RESONATORS;

ELECTRIC BREAKDOWN OF SOLIDS;

EID: 0031624689     PISSN: 07309244     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)