In situ compositional control of advanced HgCdTe-based IR detectors

Journal of Crystal Growth

Volumn 201, Issue , 1999, Pages 22-25

  Almeida, L A ^a   Dinan, J H ^b  

^a PO Box 1240   (United States)

^b NIGHT VISION AND ELECTRONIC SENSORS DIRECTORATE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELLIPSOMETRY; FEEDBACK CONTROL; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INFRARED RADIATION; MERCURY COMPOUNDS; MOLECULAR BEAM EPITAXY; PROPORTIONAL CONTROL SYSTEMS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING FILMS; SEMICONDUCTOR DEVICE STRUCTURES;

PROPORTIONAL CONTROL ALGORITHM; SPECTROSCOPIC ELLIPSOMETERS;

INFRARED DETECTORS;

EID: 0032650976     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(98)01269-X     Document Type: Article

References (9)

1. Demay Y., Arnoult D., Gailliard J.P., Medina P. J. Vac. Sci. Technol. A. 5:1987;3140.
2. Hartley R.H., Folkard M.A., Carr D., Orders P.J., Rees D., Varga I.K., Kumar V., Shen G., Steele T.A., Buskes H., Lee J.B. J. Crystal Growth. 117:1992;166.
3. Bajaj J., Irvine S.J.C., Sankur H.O., Svoronos S.A. J. Electron. Mater. 22:1993;899.
4. Svitashev K.K., Dvoretsky S.A., Sidorov Yu.G., Shvets V.A., Mardezhov A.S., Nis I.E., Varavin V.S., Liberman V., Remesnik V.G. Cryst. Res. Technol. 29:1994;931.
5. Bevan M.J., Almeida L.A., Duncan W.M., Shih H.D. J. Electron. Mater. 26:1997;502.
6. Johs B., Doerr D., Pittal S., Bhat I.B., Dakshinamurthy S. Thin Solid Films. 233:1993;293.
7. Dakshina Murthy S., Bhat I.B., Johs B., Pittal S., He P. J. Electron. Mater. 24:1995;445.
8. Almeida L.A., Johnson J.N., Benson J.D., Dinan J.H., Johs B. J. Electron. Mater. 27:1998;500.
9. Snyder P.G., Woollam J.A., Alterovitz S.A., Johs B. J. Appl. Phys. 68:1990;5925.