Modulation and Demodulation of 2 GHz Pseudo Random Binary Sequence Using SFQ Digital Circuits

IEEE Transactions on Applied Superconductivity

Volumn 9, Issue 2 PART 3, 1999, Pages 3585-3589

  Dresselhaus, Paul D ^a,b   Dean, Eric J ^a   Hodge Worsham, A ^a   Przybysz, John X ^a   Polonsky, Stas V ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

^b RSFQ Consulting Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); BINARY SEQUENCES; MODEMS; SUPERCONDUCTING MATERIALS; SYNCHRONIZATION;

PSEUDO RANDOM BINARY SEQUENCE; SINGLE FLUX QUANTUM;

DIGITAL CIRCUITS;

EID: 0032645889     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/77.783805     Document Type: Article

References (8)

1. K. Likharev and V. Semenov, "RSFQ logic/memory family: a new josephson junction technology for sub-terahertz clock frequency digital systems," IEEE Trans, on Appl. Supercond., vol. 1, pp. 3-28,1991.
2. nd ed., Wiley, 1984, ch. 3.
3. J.H. Kang, J.X. Przybysz, S.S. Martinet, A.H. Worsham, and D.L. Miller, "3.69 GHz single flux quantum pseudorandom bit sequence generator fabricated with Nb/AICVNb," IEEE Trans, on Appl. Supercond., vol. 7, pp. 2673-2676.
4. J. Sage and D.A. Feld, "Mixed analog-digital niobium superconductive circuits for a 2-gigachip-per-second spread-spectrum modem," IEEE Trans, on Appl. Supercond., vol. 7, pp. 2488-2493.
5. J. X. Przybysz, J. D. McCambridge, and P. D. Dresselhaus, "Dewar-todewar data transfer at 2 gigabits per second.," these proceedings.
6. D.L. Miller, J.X. Przybysz, A.H. Worsham, and E.J. Dean "Flux quantum sigma-delta analog-to-digital converters for rf signals," these proceedings.
7. E. J. Dean, P. D. Dresselhaus, J. X. Przybysz, A. H. Miklich and A. H. Worsham, and S.V. Polonsky, "A multi-gigahertz, low bit error rate, pseudo-random code generator for use in a spread spectrum satellite communications link," these proceedings.
8. O. Kromat, U. Ungmann, G. Hanke, and W.J. Hillery, "A 10-Gb/s silicon bipolar 1C for PRBS testing," IEEE J. Solid State Circuits, vol. 35, pp. 76-85.