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Volumn 35, Issue 16, 1999, Pages 1376-1377

80Gbit/s optoelectronic delayed flip-flop circuit using resonant tunnelling diodes and uni-travelling-carrier photodiode

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DELAY CIRCUITS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED OPTOELECTRONICS; LOGIC CIRCUITS; PHOTODIODES; RESONANT CIRCUITS; TUNNEL DIODES;

EID: 0032644811     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19990944     Document Type: Article
Times cited : (17)

References (10)
  • 4
    • 0031676207 scopus 로고    scopus 로고
    • Ultra-fast optoelectronic circuit using resonant tunnelling diodes and unitraveling-carrier photodiode
    • SANO, K., MURATA, K., AKEYOSHI, T., SHIMIZU, N., OTSUJI, T., YAMAMOTO, M., ISHIBASHI, T., and SANO, E.: 'Ultra-fast optoelectronic circuit using resonant tunnelling diodes and unitraveling-carrier photodiode', Electron. Lett., 1998, 34, (2), pp. 215-216
    • (1998) Electron. Lett. , vol.34 , Issue.2 , pp. 215-216
    • Sano, K.1    Murata, K.2    Akeyoshi, T.3    Shimizu, N.4    Otsuji, T.5    Yamamoto, M.6    Ishibashi, T.7    Sano, E.8
  • 6
    • 0029256454 scopus 로고
    • Analysis of switching time of monostable-bistable transition logic elements based on simple model calculation
    • MAEZAWA, K.: 'Analysis of switching time of monostable-bistable transition logic elements based on simple model calculation', 'Jpn. J. Appl. Phys., 1995, 34, pp. 1213-1217
    • (1995) 'Jpn. J. Appl. Phys. , vol.34 , pp. 1213-1217
    • Maezawa, K.1
  • 8
    • 0032672891 scopus 로고    scopus 로고
    • An optoelectronic logic gate monolithically integrating resonant tunneling diodes and unitraveling-carier photodiode
    • AKEYOSHI, T., SHIMIZU, N., OSAKA, J., YAMAMOTO, M., ISHIBASHI, T., SANO, K., MURATA, K., and SANO, E.: 'An optoelectronic logic gate monolithically integrating resonant tunneling diodes and unitraveling-carier photodiode', Jpn. J. Appl. Phys., 1999, 38, (2B), pp. 1223-1226
    • (1999) Jpn. J. Appl. Phys. , vol.38 , pp. 1223-1226
    • Akeyoshi, T.1    Shimizu, N.2    Osaka, J.3    Yamamoto, M.4    Ishibashi, T.5    Sano, K.6    Murata, K.7    Sano, E.8
  • 9
    • 0030230129 scopus 로고    scopus 로고
    • 10-80-Gbit/S highly extinctive electrooptic pulse pattern generation
    • OTSUJI, T., YAITA, M., NAGATSUMA, T., and SANO, E.: '10-80-Gbit/S highly extinctive electrooptic pulse pattern generation', IEEE J. Sel. Topics Quantum Electron., 1996, 2, (3), pp. 643-649
    • (1996) IEEE J. Sel. Topics Quantum Electron. , vol.2 , Issue.3 , pp. 643-649
    • Otsuji, T.1    Yaita, M.2    Nagatsuma, T.3    Sano, E.4
  • 10
    • 0027353202 scopus 로고
    • Measurement of high-speed devices and integrated circuits using electro-optic sampling technique
    • NAGATSUMA, T.: 'Measurement of high-speed devices and integrated circuits using electro-optic sampling technique', IEICE Trans. Electron.. 1993, E76-C, (1), pp. 55-63
    • (1993) IEICE Trans. Electron.. , vol.76 , Issue.1 , pp. 55-63
    • Nagatsuma, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.