Self-organized ordering of Si1-xGex nanoscale islands studied by grazing incidence small-angle X-ray scattering

Journal of Physics D: Applied Physics

Volumn 32, Issue 10 A, 1999, Pages

  Schmidbauer, M ^a   Wiebach, Th ^a   Raidt, H ^a   Hanke, M ^a   Kohler, R ^a   Wawra, H ^b  

^a HUMBOLDT UNIVERSITY   (Germany)

^b LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CHARACTERIZATION; ELECTRONIC DENSITY OF STATES; LIQUID PHASE EPITAXY; SEMICONDUCTING SILICON; SEMICONDUCTING SILICON COMPOUNDS; THIN FILMS; X RAY SCATTERING;

ELASTIC CONSTANT; ELECTRON DENSITY FLUCTUATION; GRAZING INCIDENCE SMALL ANGLE X RAY SCATTERING; SELF ORGANIZED ORDERING;

CRYSTAL STRUCTURE;

EID: 0032643702     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/10A/345     Document Type: Article

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