In situ atomic force microscopy studies of electrodeposition mechanism of cerium oxide films: Nucleation and growth out of a gel mass precursor

Electrochimica Acta

Volumn 42, Issue 16, 1997, Pages 2455-2464

  Li, Feng Bin ^a   Newman, R C ^a   Thompson, G E ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Cerium oxide films; Corrosion inhibiting films; Electrochemical nucleation and growth; Gel mass precursor in oxide deposition; In situ atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERIUM COMPOUNDS; CORROSION INHIBITORS; CRYSTALLIZATION; ELECTRODEPOSITION; FILM GROWTH; GELS; MASS TRANSFER; NUCLEATION; REACTION KINETICS;

CERIUM OXIDE; GEL MASS PRECURSORS;

PROTECTIVE COATINGS;

EID: 0031332964     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(96)00433-1     Document Type: Article

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