Using target faults to detect non-target defects

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 629-638

  Wang, Li C ^a   Mercer, M Ray ^a   Williams, Thomas W ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; DEFECTS; ELECTRIC FAULT CURRENTS;

AUTOMATIC TEST PATTERN GENERATION (ATPG); NON TARGET DEFECTS; TARGET FAULTS;

INTEGRATED CIRCUIT TESTING;

EID: 0030412067     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)