Characterisation of semiconductor heterostructures by capacitance methods

Microelectronics Journal

Volumn 30, Issue 7, 1999, Pages 665-672

  Palmer, D W ^a  

^a UNIVERSITY OF SUSSEX   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CHARGE CARRIERS; DEEP LEVEL TRANSIENT SPECTROSCOPY; ENERGY GAP; HOLE TRAPS; INTERFACES (MATERIALS); SEMICONDUCTOR DEVICE STRUCTURES; SEMICONDUCTOR QUANTUM WELLS; VOLTAGE MEASUREMENT;

CAPACITANCE VOLTAGE CHARACTERISTICS; SEMICONDUCTOR HETEROSTRUCTURES; VALENCE BAND ENERGY;

HETEROJUNCTIONS;

EID: 0032633444     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2692(99)00040-3     Document Type: Article

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