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Volumn 38, Issue 2 B, 1999, Pages 1204-1207

Highly uniform regrown in0.53Ga0.47As/AlAs/InAs resonant tunneling diodes on in0.53Ga0.47As

Author keywords

High electron mobility transistor; InGaAs; InP; Molecular beam epitaxy; Monolithic integration; Native oxide; Regrowth; Resonant tunneling diode

Indexed keywords

ATOMIC FORCE MICROSCOPY; CURRENT DENSITY; EPITAXIAL GROWTH; HIGH ELECTRON MOBILITY TRANSISTORS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MOLECULAR BEAM EPITAXY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE;

EID: 0032632375     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.38.1204     Document Type: Article
Times cited : (9)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.