Interpretation of low-energy feature in energy spectra measured from surfaces with low or negative electron affinity

Applied Surface Science

Volumn 143, Issue 1, 1999, Pages 219-222

  Yater, J E ^a   Shih, A ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SPECTROSCOPY; SEMICONDUCTING DIAMONDS; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING SILICON; SURFACES; VACUUM;

NEGATIVE ELECTRON AFFINITY; SECONDARY ELECTRON DISTRIBUTION; SECONDARY ELECTRON EMISSION SPECTROSCOPY; WIDE BANDGAP MATERIAL;

ELECTRONS;

EID: 0032632168     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00917-9     Document Type: Article

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