Mapping of large area Cadmium Zinc Telluride (CZT) wafers: Apparatus and methods

Materials Research Society Symposium - Proceedings

Volumn 487, Issue , 1998, Pages 39-44

  Brunett, B A ^a   Van Scyoc, J M ^a   Yoon, H ^a   Gilbert, T S ^a   Schlesinger, T E ^a   Lund, J C ^a   James, R B ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC CONDUCTIVITY OF SOLIDS; GAMMA RAYS; RADIATION DETECTORS; SEMICONDUCTOR DEVICE MANUFACTURE; TRANSPORT PROPERTIES; X RAYS;

CADMIUM ZINC TELLURIDE; SEMICONDUCTOR DETECTORS;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0031622074     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)