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Volumn 46, Issue 7, 1999, Pages 1123-1135

White-light interferometry with an extended zoom range

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL FILTERS; OPTICAL SENSORS; OPTICAL VARIABLES MEASUREMENT; ROUGHNESS MEASUREMENT;

EID: 0032628680     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500349908230405     Document Type: Article
Times cited : (12)

References (17)
  • 11
    • 85023913358 scopus 로고    scopus 로고
    • Proceedings of the Third International Workshop on Automatic Processing of Fringe Patterns, Bremen, Germany.: Berlin: Akademie Verlag
    • Häusler, G., Proceedings of the Third International Workshop on Automatic Processing of Fringe Patterns. 1997, Bremen, Germany. pp. 147–155. Berlin:Akademie Verlag.
    • Häusler, G.1
  • 15
    • 85023942135 scopus 로고    scopus 로고
    • Proceedings of the 17th ICO, Taejon, South Korea.: SPIE, August
    • Wyant, J. C., Proceedings of the 17th ICO. August19–231996, Taejon, South Korea. Vol. 2778, pp. 1174–1175. SPIE.
    • , vol.2778 , pp. 1174-1175
    • Wyant, J.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.