Multiple wavelengths in oblique-incidence interferometer for rough-surface measurement using laser diodes

Journal of Modern Optics

Volumn 45, Issue 4, 1998, Pages 861-872

  Franze, B ^a,b   Tiziani, H J ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b B Franze is currently with Swiss Optic   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001636502     PISSN: 09500340     EISSN: 13623044     Source Type: Journal    
DOI: 10.1080/09500349808230628     Document Type: Article

References (7)

1. Abramson, N., 1969. Optik, 30:56
2. Birch, K. G., 1973. J. Phys. E, 6:1045
3. MacBean, M., 1984. Appl. Optics, 23:4024
4. Boebel, D., Packross, B., and Tizian, H. J., 1991. Opt. Engng, 30:1910
5. Joenathan, C., Franze, B., and Tiziani, H. J., 1994. Appl. Optics, 33:7307
6. Schwider, J., Falfenstoefer, O., Schreiber, H., Zoellner, A., and Steibel, N., 1993. Opt. Engng, 32:1883
7. Ishii, Y., Chen, J., and Murata, K., 1987. Optics Lett., 12:233