-
1
-
-
84903983714
-
Profilometry with a coherence scanning microscope
-
B. S. Lee and T. C. Strand, “Profilometry with a coherence scanning microscope, ” Appl. Opt. 29, 3784-3788 (1990).
-
(1990)
Appl. Opt.
, vol.29
, pp. 3784-3788
-
-
Lee, B.S.1
Strand, T.C.2
-
2
-
-
84955326631
-
Mirau correlation microscope
-
G. S. Kino and S. S. C. Chim, “Mirau correlation microscope, ” Appl. Opt. 29, 3775-3783 (1990).
-
(1990)
Appl. Opt.
, vol.29
, pp. 3775-3783
-
-
Kino, G.S.1
Chim, S.S.C.2
-
3
-
-
0027639146
-
Interferometric profiler for rough surfaces
-
P. J. Caber, “Interferometric profiler for rough surfaces, ” Appl. Opt. 19, 3438-3441 (1993).
-
(1993)
Appl. Opt.
, vol.19
, pp. 3438-3441
-
-
Caber, P.J.1
-
4
-
-
84975646278
-
Three-dimensional sensing of rough surfaces with the coherence radar
-
T. Dresel, G. Hausler, and H. Venzke, “Three-dimensional sensing of rough surfaces with the coherence radar, ” Appl. Opt. 7, 919-925 (1992).
-
(1992)
Appl. Opt.
, vol.7
, pp. 919-925
-
-
Dresel, T.1
Hausler, G.2
Venzke, H.3
-
5
-
-
0029394573
-
Fast coherence scanning interferometry for smooth, rough and spherical surfaces
-
R. Windecker, P. Haible, and H. J. Tiziani, “Fast coherence scanning interferometry for smooth, rough and spherical surfaces, ” J. Mod. Opt. 42, 2059-2069 (1995).
-
(1995)
J. Mod. Opt.
, vol.42
, pp. 2059-2069
-
-
Windecker, R.1
Haible, P.2
Tiziani, H.J.3
-
6
-
-
0000019772
-
Measurement of intraocular optical distances using partially coherent laser light
-
A. F. Fercher, C. Hitzenberger, and M. Juchem, “Measurement of intraocular optical distances using partially coherent laser light, ” J. Mod. Opt. 38, 1327-1333 (1991).
-
(1991)
J. Mod. Opt.
, vol.38
, pp. 1327-1333
-
-
Fercher, A.F.1
Hitzenberger, C.2
Juchem, M.3
-
7
-
-
0027699308
-
Fujimoto, “In vivo retinal imaging by optical coherence tomography
-
E. A. Swanson, J. A. Izatt, M. R. Hee, D. Huang, C. P. Lin, J. S. Schuman, C. A. Puliafito, and J. G. Fujimoto, “In vivo retinal imaging by optical coherence tomography, ” Opt. Lett. 18, 1864-1866 (1993).
-
(1993)
Opt. Lett
, vol.18
, pp. 1864-1866
-
-
Swanson, E.A.1
Izatt, J.A.2
Hee, M.R.3
Huang, D.4
Lin, C.P.5
Schuman, J.S.6
Puliafito, C.A.7
-
8
-
-
84975581910
-
High-speed optical coherence domain re-flectometry
-
E. A. Swanson, D. Huang, M. R. Hee, J. G. Fujimoto, C. P. Lin, and C. A. Puliafito, “High-speed optical coherence domain re-flectometry, ” Opt. Lett. 17, 151-153 (1992).
-
(1992)
Opt. Lett.
, vol.17
, pp. 151-153
-
-
Swanson, E.A.1
Huang, D.2
Hee, M.R.3
Fujimoto, J.G.4
Lin, C.P.5
Puliafito, C.A.6
-
9
-
-
0000142682
-
Measurement of corneal thickness by low-coherence interferometry
-
C. Hitzenberger, “Measurement of corneal thickness by low-coherence interferometry, ” Appl. Opt. 31, 6637-6642 (1992).
-
(1992)
Appl. Opt.
, vol.31
, pp. 6637-6642
-
-
Hitzenberger, C.1
-
10
-
-
0000492719
-
Two methods for fast coherence tomography and topometry
-
R. Windecker, M. Fleischer, B. Franze, and H. J. Tiziani, “Two methods for fast coherence tomography and topometry, ” J. Mod. Opt. 44, 967-977 (1997).
-
(1997)
J. Mod. Opt.
, vol.44
, pp. 967-977
-
-
Windecker, R.1
Fleischer, M.2
Franze, B.3
Tiziani, H.J.4
-
11
-
-
4243093610
-
Lasermesstechnik zur Oberflachen-Qualitatskontrolle
-
U. Breitmeier, “Lasermesstechnik zur Oberflachen-Qualitatskontrolle, ” Laser Optoelektron. 24(2), 53-59 (1992).
-
(1992)
Laser Optoelektron
, vol.24
, Issue.2
, pp. 53-59
-
-
Breitmeier, U.1
-
12
-
-
84952620146
-
Optisches Autofokus-Profilometer
-
R. Windecker, “Optisches Autofokus-Profilometer, ” Tech. Messen 60, 267-270 (1993).
-
(1993)
Tech. Messen
, vol.60
, pp. 267-270
-
-
Windecker, R.1
-
13
-
-
0020737765
-
Measurement of the modal reflectivity of an antireflection coating on a superluminescent diode
-
I. P. Kaminow, G. Eisenstein, and L. W. Lutz, “Measurement of the modal reflectivity of an antireflection coating on a superluminescent diode, ” IEEE J. Quantum Electron. QE-19, 493-495 (1983).
-
(1983)
IEEE J. Quantum Electron. QE-19
, pp. 493-495
-
-
Kaminow, I.P.1
Eisenstein, G.2
Lutz, L.W.3
|