Lower bounds on energy dissipation and noise-tolerance for deep submicron VLSI

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 6, Issue , 1999, Pages

  Hegde, Rajamohana ^a   Shanbhag, Naresh R ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP SUBMICRON VLSI CIRCUITS;

BIT ERROR RATE; CODES (SYMBOLS); CONSTRAINT THEORY; ENERGY DISSIPATION; ENERGY UTILIZATION; INFORMATION THEORY; INTEGRATED CIRCUIT LAYOUT; SPURIOUS SIGNAL NOISE;

VLSI CIRCUITS;

EID: 0032626781     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)

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