Complex division as a common basis for calculating phase differences in electronic speckle pattern interferometry in one step

Applied Optics

Volumn 37, Issue 13, 1998, Pages 2589-2590

  Burke, J ^a   Helmers, H ^a  

^a UNIVERSITY OF OLDENBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038464645     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.002589     Document Type: Article

References (10)

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