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Volumn 74, Issue 12, 1999, Pages 1728-1730

Cathodoluminescence enhancement in porous silicon cracked in vacuum

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; CRACK INITIATION; ELECTRON BEAMS; ELECTRON IRRADIATION; ELECTRON TUBES; POROUS SILICON; SCANNING ELECTRON MICROSCOPY;

EID: 0032613771     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.123669     Document Type: Article
Times cited : (19)

References (18)
  • 6
    • 0004038380 scopus 로고
    • SEM microcharacterization of semiconductors
    • Academic, New York
    • SEM Microcharacterization of Semiconductors, edited by D. B. Holt and D. C. Joy, Techniques of Physics 12 (Academic, New York, 1989).
    • (1989) Techniques of Physics , vol.12
    • Holt, D.B.1    Joy, D.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.