Depth-resolved micro-Raman study of porous silicon at different oxidation states

Applied Physics Letters

Volumn 71, Issue 15, 1997, Pages 2166-2168

  Moreno, J D ^a   Agullo Rueda F ^b   Montoya, E ^b   Marcos, M L ^a   Gonzalez Velasco J ^a   Guerrero Lemus, R ^a,b   Martinez Duart J M ^a,b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344182405     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119370     Document Type: Article

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