Interface roughness scattering-limited electron mobility in AlAs/GaAs and Ga0.5In0.5P/GaAs wells

Journal of Applied Physics

Volumn 86, Issue 1, 1999, Pages 459-463

  Nag, B R ^a   Mukhopadhyay, Sanghamitra ^a   Das, Madhumita ^a  

^a UNIVERSITY OF CALCUTTA   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; ELECTRON SCATTERING; FUNCTIONS; INTEGRAL EQUATIONS; INTERFACES (MATERIALS); SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM COMPOUNDS; SURFACE ROUGHNESS;

ELECTRON SCREENING; INTERFACE ROUGHNESS SCATTERING-LIMITED ELECTRON MOBILITY;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0032606473     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370752     Document Type: Article

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