Dielectric properties of Ti, TiO2 and TiN from 1.5 to 60 eV determined by reflection electron energy loss spectroscopy (REELS) and ellipsometry

Physica Status Solidi (A) Applied Research

Volumn 175, Issue 1, 1999, Pages 429-436

  Fuentes, G G ^a   Mancheno I G ^a   Balbas F ^a   Quiros C ^a   Trigo, J F ^a   Yubero, F ^b   Elizalde, E ^a   Sanz, J M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b UNIVERSITY OF SEVILLE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC FILMS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELLIPSOMETRY; LIGHT REFLECTION; THIN FILMS; TITANIUM COMPOUNDS;

ENERGY LOSS FUNCTIONS (ELF); KRAMERS-KRONIG TRANSFORMATIONS; REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPY (REELS);

METALLIC FILMS;

EID: 0032594861     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-396X(199909)175:1<429::AID-PSSA429>3.0.CO;2-6     Document Type: Article

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