Novel spectromicroscopy: Pt-GaP studies by spatially resolved internal photoemission with near-field optics

Applied Physics Letters

Volumn 69, Issue 16, 1996, Pages 2361-2363

  Almeida, J ^a   Dell'Orto, Tiziana ^a   Coluzza, C ^a   Margaritondo, G ^a   Bergossi, O ^b   Spajer, M ^b   Courjon, D ^b  

^a EPFL   (Switzerland)

^b UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENT MEASUREMENT; IMAGE RECONSTRUCTION; INTERFACES (MATERIALS); MORPHOLOGY; OPTICAL FIBERS; OPTICAL MICROSCOPY; PLATINUM; SEMICONDUCTING GALLIUM COMPOUNDS; SURFACE PHENOMENA;

ELECTRON HOLE RECOMBINATION RATES; INTERNAL PHOTOEMISSION; PHOTOCURRENTS; PHOTOELECTRON EMISSION MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SCHOTTKY BARRIER HEIGHT;

PHOTOELECTRON SPECTROSCOPY;

EID: 0030262051     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117525     Document Type: Article

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