Breakdown and high-energy electron vacuum emission of MIS-structures

Journal of Physics D: Applied Physics

Volumn 32, Issue 16, 1999, Pages 1963-1970

  Fitting, H J ^a   Hingst, Th ^a   Schreiber, E ^a  

^a UNIVERSITY OF ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; BALLISTICS; ELECTRON EMISSION; ELECTRON TRANSPORT PROPERTIES; IMPACT IONIZATION; MONTE CARLO METHODS; MOS DEVICES; PHONONS; STACKING FAULTS; THICKNESS MEASUREMENT;

ACOUSTIC PHONONS; AVALANCHING; DEAD CRATERS; DEFECT CHANNELS; ELECTRON VACUUM EMISSION; LONGITUDINAL OPTICAL PHONONS; METAL SEMICONDUCTOR SEMICONDUCTOR LAYER DEVICES; PHONON ANNIHILATION; TOP SEMITRANSPARENT ELECTRODE;

MIS DEVICES;

EID: 0032593295     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/16/303     Document Type: Article

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