Breakdown and electron vacuum emission from MIS-structures

Proceedings of the International Conference on Electric Charge in Solid Insulators, CSC

Volumn , Issue , 1998, Pages 636-645

  Fitting, H J ^a   Hingst, Th ^a   Schreiber, E ^a  

^a UNIVERSITY OF ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; ELECTRODES; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; IONIZATION; PHONONS; SEMICONDUCTOR DEVICE STRUCTURES; VACUUM;

ELECTRON VACUUM EMISSION; IMPACT IONIZATION;

MIS DEVICES;

EID: 0031629759     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (26)