SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 541, Issue , 1999, Pages 223-228

Ferroelectric properties of SBT (Sr/Bi/Ta = 0.8/2.3/2) thin films using a novel chemical solution deposition

(5) Kim, Seung Hyun a Kim, D J a Streiffer, S K a,b Maria, J P a Kingon, Angus I a

a North Carolina State University (United States)

b ARGONNE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHEMICAL VAPOR DEPOSITION; CONDENSATION; CRYSTAL MICROSTRUCTURE; CRYSTALLIZATION; ELECTRIC PROPERTIES; FATIGUE OF MATERIALS; FERROELECTRIC MATERIALS; HYDROLYSIS; POLARIZATION; SOLID SOLUTIONS; STRONTIUM COMPOUNDS;

FERROELECTRIC THIN FILM; REMANENT POLARIZATION; STRONTIUM BISMUTH TANTALATE;

THIN FILMS;

EID: 0032592349 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Article

Times cited : (2)

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