Measurements of modulation of the total emitted current in laser-assisted field emission

Ultramicroscopy

Volumn 79, Issue 1-4, 1999, Pages 181-188

  Brugat, Manuel ^a   Hagmann, Mark J ^a  

^a Dept Elec Comp Eng Florida I ^*  (United States)

Author keywords

035; Field emission; Laser assisted; Microwaves

Indexed keywords

TUNGSTEN;

ARTICLE; CONTROLLED STUDY; FIELD EMISSION; FLAME PHOTOMETRY; LASER; MEASUREMENT; METHODOLOGY; MICROWAVE RADIATION; NONHUMAN; SIMULATION; TEMPERATURE;

COMPUTER SIMULATION; ELECTRIC CURRENTS; FIELD EMISSION CATHODES; LASER APPLICATIONS; LASER BEAM EFFECTS; MICROWAVES; PHOTOELECTRICITY; SEMICONDUCTOR LASERS; TUNGSTEN;

FIELD EMISSION CURRENT; RESONANT LASER ASSISTED FIELD EMISSION;

ELECTRON EMISSION;

EID: 0032586226     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00087-X     Document Type: Article

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