Scanning second harmonic microscopy techniques with monomode and near field optical fibers

Applied Physics Letters

Volumn 73, Issue 20, 1998, Pages 2884-2886

  Adameck, M ^a   Blum, R ^a   Eich, M ^a  

^a HAMBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFRACTION; LIGHT POLARIZATION; MICROSCOPIC EXAMINATION; MIRRORS; NONLINEAR OPTICS; OPTICAL FIBERS; PHOTOMULTIPLIERS;

NEAR FIELD OPTICAL FIBERS; SCANNING SECOND HARMONIC MICROSCOPY;

SECOND HARMONIC GENERATION;

EID: 0032538718     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122618     Document Type: Article

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