Ultimate resolution electron energy loss spectroscopy at H/Si(100) surfaces

Journal of Applied Physics

Volumn 84, Issue 12, 1998, Pages 6636-6643

  Tautz, F S ^a   Schaefer, J A ^a  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; ELECTRON ENERGY LOSS SPECTROSCOPY; ETCHING; HYDRIDES; HYDROGEN; HYDROGENATION; INFRARED SPECTROSCOPY; LOW ENERGY ELECTRON DIFFRACTION; MATHEMATICAL MODELS; MOLECULAR STRUCTURE; MOLECULAR VIBRATIONS; SURFACES;

BENDING VIBRATIONS; BOND STRETCHING; DYNAMIC DIPOLE DIPOLE INTERACTION; HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; MONOHYDRIDE SATURATION; SCISSOR VIBRATIONS; SHORT RANGE VALENCE FORCES; SPECTRAL RESOLUTION; STRETCHING VIBRATIONS;

SILICON;

EID: 0032534419     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369038     Document Type: Article

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