Use of atomic force microscopy in particle science and technology research

Colloids and Surfaces A: Physicochemical and Engineering Aspects

Volumn 133, Issue 1-2, 1998, Pages 77-88

  Yalamanchili, M R ^a,b   Veeramasuneni, S ^a   Azevedo, M A D ^a   Miller, J D ^a  

^a UNIVERSITY OF UTAH   (United States)

^b MEMC Electronic Materials Inc   (United States)

Author keywords

Atomic force microscopy; Interparticle forces; Particulate science and technology; Point of zero charge; Polymer surfaces

Indexed keywords

CERAMIC MATERIALS; COLLOIDS; INTERFACES (MATERIALS); ORGANIC POLYMERS;

INTERPARTICLE FORCES;

ATOMIC FORCE MICROSCOPY;

CELLULOSE; INK; LATEX;

ARTICLE; ATOMIC FORCE MICROSCOPY; COLLOID; IONIC STRENGTH; MEASUREMENT; PARTICULATE MATTER; PRIORITY JOURNAL; RESEARCH; SURFACE PROPERTY; TECHNOLOGY;

EID: 0032520235     PISSN: 09277757     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-7757(97)00127-1     Document Type: Article

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