Microwave power handling in engineered YBa2Cu3O7-δ grain boundaries

Applied Physics Letters

Volumn 73, Issue 15, 1998, Pages 2200-2202

  Habib, Y M ^a   Oates, D E ^a   Dresselhaus, G ^a   Dresselhaus, M S ^a   Vale, L R ^b   Ono, R H ^b  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTRIC CURRENTS; FILM GROWTH; GRAIN BOUNDARIES; MICROWAVE MEASUREMENT; RESONATORS; SINGLE CRYSTALS; SUPERCONDUCTING FILMS; THIN FILMS;

MICROWAVE FREQUENCY; SAPPHIRE BICRYSTAL SUBSTRATES; STRIPLINE RESONATOR MEASUREMENT;

YTTRIUM BARIUM COPPER OXIDES;

EID: 0032511671     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122422     Document Type: Article

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