Microwave power dependence of YBa2Cu3O7 thin-film Josephson edge junctions

Applied Physics Letters

Volumn 68, Issue 5, 1996, Pages 705-707

  Oates, D E ^a   Nguyen, P P ^a,b   Habib, Y ^a,b   Dresselhaus, G ^a,b,c   Dresselhaus, M S ^a   Koren, G ^d   Polturak, E ^d  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^d TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT DENSITY; ELECTRIC CURRENT DISTRIBUTION; ELECTRIC CURRENT MEASUREMENT; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; MATHEMATICAL MODELS; MICROWAVES; RESONATORS; SUPERCONDUCTING FILMS; THERMAL EFFECTS; YTTRIUM COMPOUNDS;

RESISTIVELY SHUNTED JUNCTION MODEL; STRIPLINE RESONATOR; YTTRIUM BARIUM COPPER OXIDE;

JOSEPHSON JUNCTION DEVICES;

EID: 0029754359     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116598     Document Type: Article

References (8)

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